Facilities

Clean room. © Laurent Ardhuin for Sorbonne University
Clean room. Lithography equipment. © Laurent Ardhuin for Sorbonne University
Clean room. Lithography equipment. © Laurent Ardhuin for Sorbonne University
Clean room. © Laurent Ardhuin for Sorbonne University
Device developed by Molecular Beam Epitaxy (insertion airlock) - © Laurent Ardhuin for Sorbonne University
Device developed by Molecular Beam Epitaxy (insertion airlock) - © Laurent Ardhuin for Sorbonne University
Device developed by Molecular Beam Epitaxy (insertion airlock) - © Laurent Ardhuin for Sorbonne University
Device developed by Molecular Beam Epitaxy (insertion airlock) - © Laurent Ardhuin for Sorbonne University
General view of SAFIR. © INSP - Cécile Duflot
Graphical Van der Graff Accelerator. © INSP - Cécile Duflot
Beam line. @ INSP - Cécile Duflot
Control room. @ INSP - Cécile Duflot
General view of SIMPA. © INSP - Cécile Duflot
NX20 atomic force microscopes from Park system allows to use 150 mm samples. INSP - Cécile Duflot
NX20 atomic force microscopes from Park system allows to use 150 mm samples. INSP - Cécile Duflot
$Diffractomètre 4 cercles à tube scellé de cuivre « X’Pert MRD » PANalytical$
4 circles diffractometer with sealed copper tube " X'Pert MRD " PANalytical - © INSP - Cécile Duflot
$Diffractomètre 5 cercles multi-configurations à anode tournante « Smartlab » Rigaku$
Rigaku 5-circle multi-configuration diffractometer with rotating anode "Smartlab" - © INSP - Cécile Duflot

The INSP has many facilities

Clean room
Molecular beam epitaxy platform – MBE
Fast Ion Beam Analysis System (SAFIR)
The SIMPA installation: the multicharged ion source and its beam line
Advanced atomic force microscopy platform (AFMAV)
X-ray diffraction

but also uses other techniques

Non-resolved/time-resolved optical methods
Acoustic and thermal methods
Local analysis and surface studies
Ion beam techniques
Electron paramagnetic resonance
Elaboration of thin films and nanomaterials