X-ray diffraction

  • Rigaku 5-circle multi-configuration diffractometer with rotating anode "Smartlab" - © INSP - Cécile Duflot

This platform aims to meet the needs of research teams concerning the x-ray characterization and analysis of materials. It concerns thin films (mainly) and powders.

It is used for out-of-plane diffraction of thin films and powder: reflectivity, theta/2theta, etc. It is mainly configured in point beam mode, a mode suitable for the study of film texture by pole figures.

The department has two diffractometers :

5-circle multi-configuration diffractometer with rotating anode ” Smartlab ” Rigaku

Diffractomètre 5 cercles

Caption: Rigaku 5-circle multi-configuration diffractometer with rotating anode “Smartlab” – © INSP – Cécile Duflot

It is equipped with a 9 kW copper rotating anode with self-alignment of the configurations allowing in particular high resolution diffraction experiments, reflectometry, diffraction of planes perpendicular to the surface in grazing incidence, texture, powder diffraction…

 

X’Pert MRD” PANalytical 4-circle diffractometer with sealed copper tube

Diffractomètre 4 cercles

Caption: 4 circles diffractometer with sealed copper tube ” X’Pert MRD ” PANalytical – © INSP – Cécile Duflot

It is used for powders, as well as in X-ray diffraction and reflectivity for less well crystallized thin films. It is mainly configured in point beam mode.

Contact

Yunlin Zheng: yunlin.zheng(at)insp.upmc.fr