This platform aims to meet the needs of research teams concerning the x-ray characterization and analysis of materials. It concerns thin films (mainly) and powders.
It is used for out-of-plane diffraction of thin films and powder: reflectivity, theta/2theta, etc. It is mainly configured in point beam mode, a mode suitable for the study of film texture by pole figures.
The department has two diffractometers :
5-circle multi-configuration diffractometer with rotating anode ” Smartlab ” Rigaku
Caption: Rigaku 5-circle multi-configuration diffractometer with rotating anode “Smartlab” – © INSP – Cécile Duflot
It is equipped with a 9 kW copper rotating anode with self-alignment of the configurations allowing in particular high resolution diffraction experiments, reflectometry, diffraction of planes perpendicular to the surface in grazing incidence, texture, powder diffraction…
X’Pert MRD” PANalytical 4-circle diffractometer with sealed copper tube
Caption: 4 circles diffractometer with sealed copper tube ” X’Pert MRD ” PANalytical – © INSP – Cécile Duflot
It is used for powders, as well as in X-ray diffraction and reflectivity for less well crystallized thin films. It is mainly configured in point beam mode.
Yunlin Zheng: yunlin.zheng(at)insp.upmc.fr