The UHV experimental device used for the surface characterization with multi-charged ion beams issued from the SIMPA source includes: a UHV analysis chamber, a UHV preparation chamber and a load-lock system for introduction. The assembly is equipped with pumping and measurement systems suitable for UHV (ion pumps with Ti sublimation and Bayard-Alpert gauges).Transfers between the chambers are compatible with the Omicron-type sample holder.
© INSP – Cécile Duflot
The analysis chamber
The analysis chamber, completely designed and manufactured in the laboratory includes:
- A 6-axis motorized goniometer (3 translations, 3 rotations with an accuracy of 5/100°) from the company Vinci Technologies making possible to heat a sample by electron bombardment up to 1000K and to cool it down to 100K;
- A retractable Faraday cup ;
- Flanges at different angles allow the installation of X-ray detectors (Si (Li), SDD, Fast SDD), for example.
The preparation chamber
The preparation chamber, also completely designed and manufactured at INSP, is connected to the analysis chamber and to an introduction load-lock. It includes:
- A 4-axis manipulator from the company UHV Design making possible to heat a sample by electron bombardment up to 1000K and to cool it down to 100K;
- An ion gun;
- An Auger spectrometer.
