Nanometric Thin Films: Formation, Interfaces and Defects - Publications

I. Trimaille, J.J. Ganem, Ian Vickridge, S. Rigo, G. Battistig, et al.. Thermal oxidation of 6H-SiC studied by oxygen isotopic tracing and narrow nuclear resonance profiling. the Sixteenth International Conference on Ion Beam Analysis, 2004, France. pp.914-918., ⟨10.1016/j.nimb.2004.01.187⟩. ⟨hal-00005210⟩
C. Goncalvez, Martine Lejeune, S. Charvet, Andreas Zeinert, Annie Grosman, et al.. Impurities and related microstructure in nanocrystalline silicon films grown by radiofrequency magnetron sputtering. Thin Solid Films, 2004, 451-452, pp.370. ⟨10.1016/j.tsf.2003.11.015⟩. ⟨hal-00004393⟩
I.C. Vickridge, O. Kaitasov, R.J. Chater, J.A. Kilner. Silicon isotopic tracing with the $^{29}$Si(p, $\gamma$) narrow resonance near 415 keV. Ion Beam Analysis Accelerators in Applied Research and Technology International Conference on Ion Beam Analysis 14 European Conference on Accelerators in Applied Research and Technology 6, Jul 1999, Dresden, Germany. pp.441-445. ⟨in2p3-00005570⟩
P.W Gilberd, P.B Johnson, I.C Vickridge, A.C Wismayer. TEM and IBA study of the thermal oxidation of V following high dose He implantation. Journal of Nuclear Materials, 1997, 244 (1), pp.51 - 58. ⟨10.1016/S0022-3115(96)00726-X⟩. ⟨hal-01513005⟩

Nanometric Thin Films: Formation, Interfaces and Defects – Publications