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314 documents
- C Tusche, Hl Meyerheim, Nathalie Jedrecy, G Renaud, A Ernst, et al.. Comment on ``Destructive effect of disorder and bias voltage on interface resonance transmission in symmetric tunnel junctions'' - Tusche et al. reply. Physical Review Letters, 2006, 96 (11), pp.119602. ⟨10.1103/PhysRevLett.96.119602⟩. ⟨hal-01288820⟩
- Jean-Louis Cantin, Jurgen von Bardeleben, Y Ke, Rp Devaty, Wj Choyke. Hydrogen passivation of carbon P-b like centers at the 3C-and 4H-SiC/SiO2 interfaces in oxidized porous SiC. Applied Physics Letters, 2006, 88 (9), pp.092108. ⟨10.1063/1.2179128⟩. ⟨hal-01288817⟩
- S Le Pevedic, Didier Schmaus, Camille Cohen. Growth of Ni-Al alloys on Ni(111): (I) Formation of epitaxial Ni3Al from ultra-thin Al deposits. Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces, 2006, 600 (3), pp.565-576. ⟨10.1016/j.susc.2005.11.010⟩. ⟨hal-01288816⟩
- E. Testa, D. Dauvergne, A. Bräuning-Demian, F. Bosch, H. Bräuning, et al.. Electron gas polarization effect induced by heavy H-like ions of moderate velocities channeled in a silicon crystal. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2006, 245 (1), pp.47-51. ⟨10.1016/j.nimb.2005.11.073⟩. ⟨hal-00023575⟩
- S. Bravina, N. Morozovsky, E.A. Eliseev, Eric Cattan, Denis Remiens, et al.. Predicted and realized improved performances of PZT film-silicon based structures for integrated pyrosensorics. Integrated Ferroelectrics, 2006, 80, pp.3-9. ⟨10.1080/10584580600655603⟩. ⟨hal-00138743⟩
- E. Chikoidze, Jurgen von Bardeleben, Y. Dumont, F. Jomard, O. Gorochov. Influence of annealing on the structural and magnetic properties of epitaxial Zn1–xMnxO films grown by MOCVD on sapphire. physica status solidi (c), 2006, 3 (4), pp.1001--1004. ⟨10.1002/pssc.200564651⟩. ⟨hal-01288818⟩
- Silvère Akamatsu, K. Y. Lee, W. Losert. Control of eutectic solidification microstructures through laser spot perturbations. Journal of Crystal Growth, 2006, 289, pp.331. ⟨10.1016/j.jcrysgro.2005.11.003⟩. ⟨hal-00017355⟩
- R. Lindström, V. Maurice, S. Zanna, L. Klein, H. Groult, et al.. Thin films of vanadium oxide grown on vanadium metal: oxidation conditions to produce V2O5 films for Li-intercalation applications and characterisation by XPS, AFM, RBS/NRA. Surface and Interface Analysis, 2006, pp.38(1) (2006) 6-18. ⟨10.1002/sia.2141⟩. ⟨hal-00165176⟩
- R. Lindström, V. Maurice, H. Groult, L. Perrigaud, S. Zanna, et al.. Li-intercalation behaviour of vanadium oxide thin film prepared by thermal oxidation of vanadium metal. Electrochimica Acta, 2006, pp.51 (2006) 5001-5011. ⟨10.1016/j.electacta.2006.01.049⟩. ⟨hal-00165178⟩
- Georges Amsel, G Battistig. The impact on materials science of ion beam analysis with electrostatic accelerators. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2005, 240 (1-2), pp.1-12. ⟨10.1016/j.nimb.2005.06.078⟩. ⟨hal-01288838⟩
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