Couches nanométriques : formation, interfaces, défauts – Publications


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314 documents

  • Annie Grosman, Camille Ortega. Nature of Capillary Condensation and Evaporation Processes in Ordered Porous Materials. Langmuir, 2005, 21 (23), pp.10515. ⟨10.1021/la051030o⟩. ⟨hal-00290438⟩
  • M. Goldmann, Philippe Fontaine, Marie-Claude Fauré, O. Konovalov, Pierre Muller, et al.. Direct Evidence for Highly Organized Networks of Circular Surface Micelles of Surfactant at the Air-Water Interface. Journal of the American Chemical Society, 2005, 127 (2), pp.512-513. ⟨10.1021/ja044779e⟩. ⟨hal-00429486⟩
  • C. Champion, A. L'Hoir, M.F. Politis, P.D. Fainstein, R.D. Rivarola, et al.. A Monte Carlo code for the simulation of heavy-ion tracks in water.. Radiation Research, 2005, 163, pp.222-231. ⟨10.1667/RR3295⟩. ⟨hal-00021990⟩
  • Np Barradas, N Added, Wm Arnoldbik, I Bogdanovic-Radovic, W Bohne, et al.. A round robin characterisation of the thickness and composition of thin to ultra-thin AlNO films. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2005, 227 (3), pp.397-419. ⟨10.1016/j.nimb.2004.08.021⟩. ⟨hal-01288831⟩
  • A. Bourgeois, A. Brunet-Bruneau, Serge Fisson, J. Rivory, M. Matheron, et al.. Adsorption and Desorption Isotherms at Ambient Temperature Obtained by Ellipsometric Porosimetry to Probe Micropores in Ordered Mesoporous Silica. Adsorption - Journal of the International Adsorption Society, 2005, 11 (1), pp.195. ⟨10.1007/s10450-005-5922-7⟩. ⟨hal-00005410⟩
  • Jurgen von Bardeleben, Jean-Louis Cantin, L Ke, Y Shishkin, Rp Devaty, et al.. Interface defects in n-type 3C-SiC/SiO2: An EPR study of oxidized porous silicon carbide single crystals. 5th European Conference on Silicon Carbide and Related Materials, Aug 2004, Bologna, Unknown Region. pp.273-276. ⟨hal-01288832⟩
  • A Morilla, Jg Lopez, G Battistig, Jean-Louis Cantin, Jc Cheang-Wong, et al.. RBS-channeling and EPR studies of damage in 2 MeV Al2+-implanted 6H-SiC substrates. 5th European Conference on Silicon Carbide and Related Materials, Aug 2004, Bologna, Unknown Region. pp.291-294. ⟨hal-01288836⟩
  • Jurgen von Bardeleben, Jean-Louis Cantin, Ian Vickridge, Yw Song, S Dhar, et al.. Modification of the oxide/semiconductor interface by high temperature NO treatments: A combined EPR, NRA and XPS study on oxidized porous and bulk n-type 4H-SiC. 5th European Conference on Silicon Carbide and Related Materials, Aug 2004, Bologna, Unknown Region. pp.277-280. ⟨hal-01288837⟩
  • H Colder, M Morales, R Rizk, Ian Vickridge. Characterization of SiC thin film obtained by magnetron reactive sputtering : IBA, IR and Raman studies. 5th European Conference on Silicon Carbide and Related Materials, Aug 2004, Bologna, Unknown Region. pp.287-290. ⟨hal-01288833⟩
  • J.J. Ganem, I. Trimaille, Ian Vickridge, D. Blin, F. Martin. Study of thin hafnium oxides deposited by atomic layer deposition. the Sixteenth International Conference on Ion Beam Analysis, 2004, France. pp.856-861., ⟨10.1016/j.nimb.2004.01.176⟩. ⟨hal-00005053⟩