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311 documents
- Np Barradas, N Added, Wm Arnoldbik, I Bogdanovic-Radovic, W Bohne, et al.. A round robin characterisation of the thickness and composition of thin to ultra-thin AlNO films. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2005, 227 (3), pp.397-419. ⟨10.1016/j.nimb.2004.08.021⟩. ⟨hal-01288831⟩
- A. Bourgeois, A. Brunet-Bruneau, Serge Fisson, J. Rivory, M. Matheron, et al.. Adsorption and Desorption Isotherms at Ambient Temperature Obtained by Ellipsometric Porosimetry to Probe Micropores in Ordered Mesoporous Silica. Adsorption - Journal of the International Adsorption Society, 2005, 11 (1), pp.195. ⟨10.1007/s10450-005-5922-7⟩. ⟨hal-00005410⟩
- Jurgen von Bardeleben, Jean-Louis Cantin, L Ke, Y Shishkin, Rp Devaty, et al.. Interface defects in n-type 3C-SiC/SiO2: An EPR study of oxidized porous silicon carbide single crystals. 5th European Conference on Silicon Carbide and Related Materials, Aug 2004, Bologna, Unknown Region. pp.273-276. ⟨hal-01288832⟩
- A Morilla, Jg Lopez, G Battistig, Jean-Louis Cantin, Jc Cheang-Wong, et al.. RBS-channeling and EPR studies of damage in 2 MeV Al2+-implanted 6H-SiC substrates. 5th European Conference on Silicon Carbide and Related Materials, Aug 2004, Bologna, Unknown Region. pp.291-294. ⟨hal-01288836⟩
- H Colder, M Morales, R Rizk, Ian Vickridge. Characterization of SiC thin film obtained by magnetron reactive sputtering : IBA, IR and Raman studies. 5th European Conference on Silicon Carbide and Related Materials, Aug 2004, Bologna, Unknown Region. pp.287-290. ⟨hal-01288833⟩
- Jurgen von Bardeleben, Jean-Louis Cantin, Ian Vickridge, Yw Song, S Dhar, et al.. Modification of the oxide/semiconductor interface by high temperature NO treatments: A combined EPR, NRA and XPS study on oxidized porous and bulk n-type 4H-SiC. 5th European Conference on Silicon Carbide and Related Materials, Aug 2004, Bologna, Unknown Region. pp.277-280. ⟨hal-01288837⟩
- J.J. Ganem, I. Trimaille, Ian Vickridge, D. Blin, F. Martin. Study of thin hafnium oxides deposited by atomic layer deposition. the Sixteenth International Conference on Ion Beam Analysis, 2004, France. pp.856-861., ⟨10.1016/j.nimb.2004.01.176⟩. ⟨hal-00005053⟩
- I. Trimaille, J.J. Ganem, Ian Vickridge, S. Rigo, G. Battistig, et al.. Thermal oxidation of 6H-SiC studied by oxygen isotopic tracing and narrow nuclear resonance profiling. the Sixteenth International Conference on Ion Beam Analysis, 2004, France. pp.914-918., ⟨10.1016/j.nimb.2004.01.187⟩. ⟨hal-00005210⟩
- C. Goncalvez, Martine Lejeune, S. Charvet, Andreas Zeinert, Annie Grosman, et al.. Impurities and related microstructure in nanocrystalline silicon films grown by radiofrequency magnetron sputtering. Thin Solid Films, 2004, 451-452, pp.370. ⟨10.1016/j.tsf.2003.11.015⟩. ⟨hal-00004393⟩
- I.C. Vickridge, O. Kaitasov, R.J. Chater, J.A. Kilner. Silicon isotopic tracing with the $^{29}$Si(p, $\gamma$) narrow resonance near 415 keV. Ion Beam Analysis Accelerators in Applied Research and Technology International Conference on Ion Beam Analysis 14 European Conference on Accelerators in Applied Research and Technology 6, Jul 1999, Dresden, Germany. pp.441-445. ⟨in2p3-00005570⟩
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