In Situ Mapping of the Vectorial Electric Field within a Nanocrystal-Based Focal Plane Array Using Photoemission Microscopy Adrien Khalil, Mariarosa Cavallo, Erwan Bossavit, Rodolphe Alchaar, Tung Huu Dang, Corentin Dabard, Huichen Zhang, Nicolas Ledos, Victor Parahyba, Pierre Potet, James K. Utterback, Yoann … Lire la suite de Article en couverture d’ACS Appl. Electron. Mater